Range of measured wavelength: 350-1100mn

A fiber optics system with little chroma dispersion

Digital signal processing system of light intensity signals

Accuracy of measured wavelength: 0.1nm

Useful for thickness measurement and thickness control of film being deposited. Wavelengths between ultraviolet and near-infrared, ranging from 380nm to 1100nm.

Adopting a way that uses grating, the equipment is able to extract any wavelength in 1nm segments.

Adopting a high resolution A/D converter and 16-bit computer, the equipment achieves high performance with a command accuracy of ±0.01%.

Remote-controllable via GP-IB or RS-232C.

Useful for thickness measurement and thickness control of film being deposited that are within a range of 430-750nm.

The optical film thickness meter has improved external interfaces and auto-measurement functions.

With a high-performance embedded microprocessor, the equipment achieves high performance with a command accuracy of ±0.01% and an accurate measurement at 0.08 second intervals.

Fully remote-controllable via GP-IB or external signals.

Supports a broad range of wavelengths ranging from 860 to 1700nm. It has such a high resolution and sensitivity that it is suitable for the thickness control of various optical communication filters including DWDM.

Embedded transparent system enables it to provide self-controlled compensation.

Noise is extremely reduced with an ultra-high intensity light source.

Remote control is available with GP-IB interface.