An optical film thickness gauge that controls high-precision optical thin films
- Application:
- Components
Features
- Employs a fiber optics system with less chromatic aberration
- Performs digital signal processing of light volume signals
- Achieves the wavelength measurement precision setting of 0.1 nm
Specification outline
| Model | OPM-Z1-VIS | OPM-Z1-UV | OPM-Z1-NIR | OPM-D1-VIS |
|---|---|---|---|---|
| Applicable wavelength | Visible | Ultraviolet | Near-infrared | Visible |
| Wavelength driving range | 350 nm-1,100 nm | 200 nm-800 nm | 700 nm-2,400 nm | 350 nm-1,100 nm |
| Monitoring method | Indirect (Monitoring glass) | Direct (Actual substrate on the dome) | ||
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* Product specifications are subject to change for performance improvement without prior notice. For details, please contact our sales representatives.