Load lock type sputtering system for dielectric multilayer films

High functionality for the electronic device market mainly centered on dielectric multi-layer films

Application:
Electron and electricity control

Our RAS method was developed and made highly functional for electronic devices to meet the demands for sophisticated and higher frequency devices.

Features

  1. A system as the de facto standard for temperature compensated films necessary for TC (Temperature compensated)-SAW
  2. It is also expected to serve as a thin film deposition system for acoustic reflectors employed in SMRs (Solid Mounted Resonators), toward the achievement of higher frequency

Cooperation: Professor Hashimoto of Chiba University

Specification outline

Model SLS-18 SLS-27
Substrate drum size ⌀ 1,100 mm x 230 mm ⌀ 900 mm x 400 mm
Radical source ICP RF power source
Sputtering source Dual cathode, 18” x 5” planer cathode Dual cathode, 27” x 5” planer cathode
Exhaust system [CH-1] Roughing unit
[CH-2] 14-inch TMP x 2
Meissner trap
Roughing unit
[CH-1] Roughing unit
[CH-2] 14-inch TMP x 4
Meissner trap
Roughing unit
Option OPM-Z1 / rotary cathode / CH-1 target/ bias mechanism / SEMI/GEM-compatible interface
Contact
We propose systems that meet
your requirements for functions
and applications.
Please feel free to contact us.
Sales Department
+81-45-650-2411
Operating hours: 9:00 – 17:00
[excluding Saturdays, Sundays, and holidays]
* Product specifications are subject to change for performance improvement without prior notice. For details, please contact our sales representatives.